Spectrometers > Features
- Non-scanning systems allow for the collection of spectral information at all wavelengths simultaneously.
- 2D detectors permit collection of separate spectra along each point in a slit simultaneously.
- Spectral ranges cover up to 95%of an octave anywhere from 360 to 2500 nm.
- No second order effects due to carefully selected spectral coverage and cutoff filters.
- Use polarization independent, high efficiency over a broad spectral range, low noise volume phase holographic transmission diffraction gratings.
- Optical and mechanical design specifically developed to deliver efficient management of scattered and reflected light, resulting in extremely low level of parasitic light.
- System performance limited by detector electronics, not optical design.
- Spectral and spatial resolution limited by the detector pixel size down to 10 microns. (i.e. the system can resolve 10 microns)
- F/4 or F/3, high throughput, low noise, refractive optics produce diffraction limited spots for all wavelengths and all points of the slit.
- Available detector arrays up to 25.4 x 12 mm in size.
- Slit length up to 12 mm in length and minimum 10 micron width.
- Specialized systems with high spectral resolution, but reduced spectral range of 0.5 and 0.3 of an octave.
- Specialized high resolution OCT and high dynamic range Raman systems.
- “Smile effect” free image of the slit, allowing for fast signal binning along the slit, practically without impact on the resolution and without the need for mathematical processing of the image.
- High imaging quality gives efficient light delivery to small pixels, high spectrum contrast and low cross talk between channels.
- No moving parts (except mechanical shutter in some models) and very stable mechanical design secures exceptional mechanical wavelength reproducibility, limited by the performance of the electronics.
- Modular mechanical design allows easy customization of a high performance spectrometer to specific customer needs.
- Light tight design permits use of the system even under strong ambient illumination.
- Built-in, highly light tight shutter allows for dark current measurement even in the presence of a very strong light within the sample path.
- Large selection of detector arrays to cover required spectral range and to meet our customer’s needs.
- Large variety of sample interfaces to configure spectrometer as:
- high performance system with easy signal binning along the slit;
- C-mount, F-mount or custom made mounts for attachment of the spectrometer to any imaging system as microscope, photographic or TV camera lenses, telescopes or any other imaging optics to perform as a line imaging spectrometer;
- fiber-optic interface for remote light delivery and multi-channel operation;
- SMA ports mounted on the spectrometer front for multichannel systems isolate all subsystems of the spectrometer for applications which require frequent channel configuration changes.
